ABEX TECHNOLOGIES CO. LTD
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Laser System
Light Analysis
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Multilane
AT4080
4-lane, 64 GBaud AWG & BERT cassette
The AT4080 is part of Multilane’s high-speed instrumentation family for high volume production wafer and packaged silicon test. The AT4080 is a fully integrated extension of the V93000 tester experience, taking full advantage of the V93000 Smartest software tools and docking mechanics.
The AT4080 consists of 4 differential transmit channels that can be synchronized to other AT instruments in the V93000.
The Multilane instruments reside directly under the loadboard, allowing minimum coax cable length from the instruments to the device under test (DUT). SMPM Blindmate coax connections between the instruments and the loadboard allow quick DUT loadboard changeover during production testing.
AT4079B
8-lane, 30 GBaud BERT cassette, NRZ/PAM4
AT4039D
4-lane, 56 Gbps (28 GBaud) BERT cassette
V93000 HSIO
High-Speed Solution
AT4025
4-channel, 35 GHz bandwidth digital sampling oscilloscope cassette
AT93000-UBOX
Utility Box
AT4039E
4-lane, 112 Gbps (56 GBaud) BERT cassette
AT93000-DIAG
Diagnostic Kit
4-Channel Differential Arbitrary Wave Form Generator with selectable Baud Rate in the range of 1-64 GBd, 8-bit DAC, and User Defined Modulation
2 Dual-Channel (I/Q) Differential Pulse Pattern Generators with selectable Baud Rate in the range of 25-64 GBd, NRZ/PAM-4 Modulation, and Independent 7-tap FFE on each transmitter.
Ability to generate coherent signals for QAM modulation (horizontal and vertical I/Q pairs)
The wide range of bitrate coverage allows PHY testing of Ethernet, PCIe Gen 4/5/6, USB and others • Independent control of inner eye levels
Ability to tune the bit rate in very fine steps to facilitate finding locking margin
Library of pre-defined waveforms
Ability to generate custom modulation like PAM7, PAM9, etc. in AWG mode
DATASHEET